发明名称 X-RAY ATTENUATING MEMBER, X-RAY ATTENUATING METHOD, XAFS (X-RAY ABSORPTION FINE STRUCTURE) EXPERIMENTAL APPARATUS AND XAFS MEASURING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To set X-ray intensity within a detection limit (a proportional region) of an X-ray detector without a replacement of the X-ray detector and an output adjustment of an X-ray source. <P>SOLUTION: The X ray is made to enter at a predetermined location an X-ray attenuating member 10 continuously changing its own thickness in the longitudinal direction L. The X-ray intensity is attenuated at an attenuation rate corresponding to the thickness at the incident location of the X ray in the X-ray attenuating member 10. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2004317299(A) 申请公布日期 2004.11.11
申请号 JP20030111644 申请日期 2003.04.16
申请人 UNIV TOKYO 发明人 FUKAWA KAZUHIRO;ONO KATSUO;OKITSU KOHEI
分类号 G01N23/06;(IPC1-7):G01N23/06 主分类号 G01N23/06
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