发明名称 |
X-RAY ATTENUATING MEMBER, X-RAY ATTENUATING METHOD, XAFS (X-RAY ABSORPTION FINE STRUCTURE) EXPERIMENTAL APPARATUS AND XAFS MEASURING METHOD |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To set X-ray intensity within a detection limit (a proportional region) of an X-ray detector without a replacement of the X-ray detector and an output adjustment of an X-ray source. <P>SOLUTION: The X ray is made to enter at a predetermined location an X-ray attenuating member 10 continuously changing its own thickness in the longitudinal direction L. The X-ray intensity is attenuated at an attenuation rate corresponding to the thickness at the incident location of the X ray in the X-ray attenuating member 10. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
申请公布号 |
JP2004317299(A) |
申请公布日期 |
2004.11.11 |
申请号 |
JP20030111644 |
申请日期 |
2003.04.16 |
申请人 |
UNIV TOKYO |
发明人 |
FUKAWA KAZUHIRO;ONO KATSUO;OKITSU KOHEI |
分类号 |
G01N23/06;(IPC1-7):G01N23/06 |
主分类号 |
G01N23/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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