发明名称 Optimization method of deposition time and an optimization system of deposition time
摘要 An optimum method for deposition time is provided that can improve uniformity of processing time of oxidation thickness. When starting a heat oxidation process, a time for optimum oxidation processing in the process management system is calculated based on atmospheric pressure data, a target thickness of that process, oxidization time, thickness data and atmospheric pressure data in the immediately preceding process under the same oxidization processing job. The optimum system comprises a process management system such as a host computer, a device having a barometer, a heat oxidation-processing device and a thickness-measuring device. The host computer, the barometer, the heat oxidation processing device and the thickness-measuring device are connected via a network so as to transmit data to and from each device.
申请公布号 US2004225453(A1) 申请公布日期 2004.11.11
申请号 US20040785711 申请日期 2004.02.23
申请人 TADANO AKIRA;INOUE YUSUKE;YOKOYAMA ISAO 发明人 TADANO AKIRA;INOUE YUSUKE;YOKOYAMA ISAO
分类号 H01L21/31;H01L21/027;H01L21/316;H01L21/66;(IPC1-7):G06F19/00;G01N31/00;F26B5/04 主分类号 H01L21/31
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