发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To improve operational stability of a power MISFET with a sensor. SOLUTION: A main MISFET<SB>QMAIN</SB>and a sub MISFET<SB>QSUB</SB>are disposed while separating a well 3A of the main MISFET<SB>QMAIN</SB>and a well 3B of the sub MISFET<SB>QSUB</SB>just at a predetermined interval so as to set voltage resistance similar to the drain breakdown voltage of the main MISFET<SB>QMAIN</SB>and the sub MISFET<SB>QSUB</SB>therebetween, so that the drain breakdown voltage of the sub MISFET<SB>QSUB</SB>is matched with the drain breakdown voltage of the main MISFET<SB>QMAIN</SB>while preventing a malfunction such that the sub MISFET<SB>QSUB</SB>is turned on approximately simultaneously with the main MISFET<SB>QMAIN</SB>. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004319861(A) 申请公布日期 2004.11.11
申请号 JP20030113607 申请日期 2003.04.18
申请人 RENESAS TECHNOLOGY CORP 发明人 HARUYAMA MASAMITSU;FUWA MIKIO
分类号 H01L21/8234;H01L27/088;(IPC1-7):H01L21/823 主分类号 H01L21/8234
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