METHOD FOR MEASUREMENT OF THREE-DIMENSIONAL OBJECTS BY SINGLE-VIEW BACKLIT SHADOWGRAPHY

摘要

The invention relates to a method for measurement of three-dimensional objects by single-view backlit shadowgraphy. According to the invention, at least one geometrical parameter of such an object (32), for example, the thickness of a hollow sphere, translucent or transparent to a visible light, may be measured, by determination of the optical characteristics of the object, by means of which at least one optical model for the propagation of light through the object can be established, said model comprising at least one equation relating said parameter to the result of an observation made directly on an image of the object. Said image is produced by observation of the object with single-view backlit shadowgraphy, whereby said image is acquired, the observation is made, and the parameter is determined by means of the equation and the result of the observation.