发明名称
摘要 The present invention discloses a metal-insulator-metal (MIM) capacitor and a method for fabricating the MIM capacitor, comprising forming a bottom insulation layer, a capacitor electrode material layer, and a hard mask material layer on a semiconductor substrate having a metal wire thereon; forming a hard mask by etching the hard mask material layer using a photosensitive mask; forming a capacitor electrode by etching the capacitor electrode material layer using the hard mask as an etching mask; and forming a top insulation layer on an entire surface of the semiconductor.
申请公布号 KR100456829(B1) 申请公布日期 2004.11.10
申请号 KR20020033733 申请日期 2002.06.17
申请人 发明人
分类号 H01L23/52;H01L27/04;H01G4/228;H01G4/33;H01L21/02;H01L21/311;H01L21/3205;H01L21/768;H01L21/822;H01L23/522;H01L45/00 主分类号 H01L23/52
代理机构 代理人
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