发明名称 CVD METHOD AND DEVICE FOR FORMING SILICON-CONTAINING INSULATION FILM
摘要 A CVD apparatus (2) forms an insulating film, which is a silicon oxide film, silicon nitride film, or silicon oxynitride film. The CVD apparatus includes a process chamber (8) to accommodate a target substrate (W), a support member (20) to support the target substrate in the process chamber, a heater (12) to heat the target substrate supported by the support member, an exhaust section (39) to vacuum-exhaust the process chamber, and a supply section (40) to supply a gas into the process chamber. The supply section includes a first circuit (42) to supply a first gas of a silane family gas, a second circuit (44) to supply a second gas, which is an oxidizing gas, nitriding gas, or oxynitriding gas, and a third circuit (46) to supply a third gas of a carbon hydride gas, and can supply the first, second, and third gases together. <IMAGE>
申请公布号 EP1475828(A1) 申请公布日期 2004.11.10
申请号 EP20030701067 申请日期 2003.01.14
申请人 TOKYO ELECTRON LIMITED 发明人 KUMAGAI, TAKESHI;KATOH, HITOSHI;LEE, JINSU;MAKU, SHINGO
分类号 H01L21/316;C23C16/30;C23C16/34;C23C16/40;C23C16/452;C23C16/455;H01L21/318;(IPC1-7):H01L21/316 主分类号 H01L21/316
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