发明名称 Chip scale package and method of fabricating the same
摘要 Disclosed are a chip scale package and a method of fabricating the chip scale package. The chip scale package comprises an insulating layer formed on the upper surface of a chip provided with a plurality of terminals on its one surface, a plurality of conductive layers formed on the insulating layer and spaced from each other by a designated distance so as to be connected to each of a plurality of the terminals, and a plurality of electrode surfaces formed on each of the upper surfaces of a plurality of the conductive layers. The chip scale package is miniaturized in the whole package size. Further, the method of fabricating the chip scale package does not require a wire-bonding step or a via hole forming step, thereby simplifying the fabrication process of the chip scale package and improving the reliability of the chip scale package.
申请公布号 US6815257(B2) 申请公布日期 2004.11.09
申请号 US20020329519 申请日期 2002.12.27
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 YOON JOON HO;CHOI YONG CHIL;BAE SUK SU
分类号 H01L23/12;H01L21/301;H01L21/304;H01L21/60;H01L23/04;H01L23/31;H01L23/485;H01L33/38;H01L33/62;H05K3/34;(IPC1-7):H01L21/44 主分类号 H01L23/12
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