发明名称 |
Testing circuit for charge detection circuit, LSI, image sensor, and testing method for the charge detection circuit |
摘要 |
A testing circuit 1, provided between an input terminal IN of an LSI 2 and the CSA 20, includes a switch NSW (a third switch), a capacitor CT which is connected in parallel to the switch NSW, and switches TC1 (a first switch) and TC2 (a second switch) which are connected in series across the capacitor CT. With this arrangement, the circuit including the capacitor CT and the CSA 20 can serve as a reverse amplifier circuit and can input a voltage waveform instead of the charges. Therefore, a conventional charge supply circuit is not necessary when the testing of a reading circuit 16 is carried out.
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申请公布号 |
US6815658(B2) |
申请公布日期 |
2004.11.09 |
申请号 |
US20020252686 |
申请日期 |
2002.09.24 |
申请人 |
SHARP KABUSHIKI KAISHA |
发明人 |
OKADA HISAO;TAKAHASHI MASAYUKI;OGAWA HIROAKI |
分类号 |
G01R31/316;G01R31/28;G11C27/02;G11C29/02;H01L27/14;H01L27/146;H04N5/32;H04N5/335;H04N5/357;H04N5/363;H04N5/369;H04N5/374;H04N5/378;H04N17/00;(IPC1-7):H01J40/14 |
主分类号 |
G01R31/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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