发明名称 Microprocessor internally provided with test circuit
摘要 A microprocessor includes: a memory storing a program and various data; a processor core executing the program stored in the memory; an external bus interface serving as an interface portion of an external bus connected to an external device; a test circuit receiving a program counter value of an instruction to be executed by the processor core for outputting a test event signal for testing the microprocessor in synchronization with an operation timing of the processor core; a test event signal output terminal for outputting the test event signal to an external portion of the microprocessor, and an external event request signal input terminal provided for applying the processor core an external event request signal used by the external device to notify an event request with respect to the processor core.
申请公布号 US6816983(B2) 申请公布日期 2004.11.09
申请号 US20010785466 申请日期 2001.02.20
申请人 RENESAS TECHNOLOGY CORP. 发明人 KURAFUJI TAKASHI
分类号 G06F11/22;G01R31/28;G06F11/00;G06F11/25;G06F11/267;G06F11/27;G06F15/78;H03K19/003;(IPC1-7):G06F11/00 主分类号 G06F11/22
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