发明名称 Method of fabricating a ferroelectric memory device
摘要 A ferroelectric memory device and a method of fabricating the same are provided. The ferroelectric memory device includes at least two capacitor patterns and a plate line. Each of the capacitor patterns includes a lower electrode, a ferroelectric layer, and an upper electrode that are stacked on a semiconductor substrate. A top of the plate line is covered with an oxygen barrier layer, and a sidewall of the plate line is covered with an oxygen barrier spacer.
申请公布号 US6815227(B2) 申请公布日期 2004.11.09
申请号 US20030744378 申请日期 2003.12.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 AN HYEONG-GEUN
分类号 H01L27/105;H01L21/02;H01L21/8246;H01L27/115;(IPC1-7):H01L21/00 主分类号 H01L27/105
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