发明名称 Method of manufacturing semiconductor devices
摘要 Subjected to obtain a crystalline TFT which simultaneously prevents increase of OFF current and deterioration of ON current. A gate electrode of a crystalline TFT is comprised of a first gate electrode and a second gate electrode formed in contact with the first gate electrode and a gate insulating film. LDD region is formed by using the first gate electrode as a mask, and a source region and a drain region are formed by using the second gate electrode as a mask. By removing a portion of the second gate electrode, a structure in which a region where LDD region and the second gate electrode overlap with a gate insulating film interposed therebetween, and a region where LDD region and the second gate electrode do not overlap, is obtained.
申请公布号 US6815273(B2) 申请公布日期 2004.11.09
申请号 US20020292830 申请日期 2002.11.12
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 NAKAJIMA SETSUO;OHTANI HISASHI;YAMAZAKI SHUNPEI
分类号 G02B27/00;G02B27/01;G02F1/1362;H01L21/336;H01L21/77;H01L21/84;H01L29/423;H01L29/786;(IPC1-7):H01L21/00 主分类号 G02B27/00
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