发明名称 |
NON-VOLATILE SEMICONDUCTOR MEMORY TO IMPROVE RELIABILITY OF MEMORY OPERATION |
摘要 |
<p>PURPOSE: A non-volatile semiconductor memory is provided to improve reliability of a memory operation by performing an erase/write only on the data of a memory cell to be rewritable. CONSTITUTION: A plurality of the first cell units are composed of one memory cell and two select gate transistors formed at both sides of the one memory cell. A wordline is commonly connected to each memory cell of the plurality of the first cell units. A plurality of bitlines are respectively connected to the plurality of the first cell units. A plurality of sense amplifiers are correspondingly installed in the plurality of bitlines. The plurality of the first cell units are divided into a plurality of blocks. In an erase operation, an erase circuit sets the potential of the plurality of bitlines in a block unit.</p> |
申请公布号 |
KR20040093410(A) |
申请公布日期 |
2004.11.05 |
申请号 |
KR20040027559 |
申请日期 |
2004.04.21 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
SAKUI KOJI |
分类号 |
G11C16/02;G06K19/07;G11C5/02;G11C11/34;G11C16/04;G11C16/06;G11C16/10;G11C16/16;H01L21/8247;H01L27/10;H01L27/115;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L29/78 |
主分类号 |
G11C16/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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