发明名称 |
Systems and methods for absolute positioning using repeated quasi-random pattern |
摘要 |
An absolute 2D position-sensing device is usable to measure the position of a first element with respect to a second element. A 2D absolute scale includes an integrated 2D absolute scale pattern extending over the 2D scale area along each measuring axis of the scale. The integrated 2D absolute scale pattern includes a predetermined quasi-random pattern repeatedly interleaved with a plurality of code portions along each axis. Each code portion includes a plurality of code elements indicative of an absolute measurement value. The offset of the quasi-random pattern relative to a readhead of the device is combined with the absolute measurement value to determine an absolute position to a very high resolution over a relatively large 2D range.
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申请公布号 |
US2004218181(A1) |
申请公布日期 |
2004.11.04 |
申请号 |
US20030427921 |
申请日期 |
2003.05.02 |
申请人 |
MITUTOYO CORPORATION |
发明人 |
JONES BENJAMIN K.;NAHUM MICHAEL |
分类号 |
G01B11/00;G01D5/245;G01D5/347;(IPC1-7):G01B11/00 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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