发明名称 Systems and methods for absolute positioning using repeated quasi-random pattern
摘要 An absolute 2D position-sensing device is usable to measure the position of a first element with respect to a second element. A 2D absolute scale includes an integrated 2D absolute scale pattern extending over the 2D scale area along each measuring axis of the scale. The integrated 2D absolute scale pattern includes a predetermined quasi-random pattern repeatedly interleaved with a plurality of code portions along each axis. Each code portion includes a plurality of code elements indicative of an absolute measurement value. The offset of the quasi-random pattern relative to a readhead of the device is combined with the absolute measurement value to determine an absolute position to a very high resolution over a relatively large 2D range.
申请公布号 US2004218181(A1) 申请公布日期 2004.11.04
申请号 US20030427921 申请日期 2003.05.02
申请人 MITUTOYO CORPORATION 发明人 JONES BENJAMIN K.;NAHUM MICHAEL
分类号 G01B11/00;G01D5/245;G01D5/347;(IPC1-7):G01B11/00 主分类号 G01B11/00
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