| 摘要 |
The present invention relates to a semiconductor device; and, more particularly, to a delay adjusting circuit which is required to adjust a delay time of an internal circuit in a test mode and required to verify a characteristic and a margin of the semiconductor device. The delay adjusting apparatus according to the present invention comprises: a normal delayer for delaying an input signal from an external circuit; a delay time storage for maintaining a predetermined delay time produced by a control signal and delaying the input signal based on the predetermined delay time; and a selector for selectively outputting one of output signals from the normal delayer and the delay time storage in response to a test mode signal.
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