发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit which can be used as a product without altering a mask by reducing the time required for analyzing troubles of an LSI due to a voltage drop significantly. SOLUTION: The semiconductor integrated circuit comprises a voltage drop detecting circuit 200 for detecting erroneous operation due to a voltage drop, and a voltage regulating circuit 300 for elevating the voltage at the voltage drop part stepwise when the voltage drop detecting circuit 200 detects a trouble. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2004311558(A) |
申请公布日期 |
2004.11.04 |
申请号 |
JP20030100115 |
申请日期 |
2003.04.03 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
OO KINYA;SHIROYAMA HIROAKI;ODA MASAHARU |
分类号 |
H01L27/04;H01L21/822;(IPC1-7):H01L21/822 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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