| 摘要 |
PROBLEM TO BE SOLVED: To provide a memory device capable of preventing an increase in the number of output terminals. SOLUTION: In the memory device having a plurality of data storage areas, a batch test mode for batch-testing all the data areas and an individual test mode for individually testing each data storage area, the output part of each data storage area is divided into a plurality of output blocks, the logical sum of the data of the output blocks is outputted from a first output line disposed for each output block on the batch-test mode, and the data of the output blocks are outputted from a second output line for each output block by using a selector connected in common to the output blocks. COPYRIGHT: (C)2005,JPO&NCIPI
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