发明名称 BOARD DEFLECTION METROLOGY USING PHOTOELECTRIC AMPLIFIERS
摘要 <p>Manufacturers test printed circuit boards (PCB) to ensure that all components have been soldered to the correctly. Some tests cause the boards to deflect, which can damage component-to-board interfaces (i.e., solder joints) or components. Embodiments of the present invention measure the amount of PCB deflection before, during, and after the PCB is subject to mechanical load using photoelectric amplifiers, which send and receive light beams to targets mounted an the PCB surface through optical fibers and lenses mounted in a head assembly. The intensity of received light beams are proportional to analog voltages output by the photoelectric amplifiers and to the distance between the head assemblies and the targets. A data acquisition system converts the analog voltages to digital voltages and a software interface correlates the digital voltages to PCB deflection/displacement. A GUI displays deflection before, during, and after the PCB is subject to mechanical load.</p>
申请公布号 WO2004095904(A1) 申请公布日期 2004.11.04
申请号 WO2004US07632 申请日期 2004.03.12
申请人 INTEL CORPORATION 发明人 MCALLISTER, ALAN;HEZELTINE, ALTON
分类号 H05K1/02;H05K1/18;H05K13/08;(IPC1-7):H05K13/08 主分类号 H05K1/02
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