发明名称 OPTION CIRCUIT WITHOUT USING AN EXTERNAL PAD AND A METAL MASK OPTION
摘要 PURPOSE: An option circuit is provided, which dose a test by selecting an input/output structure through one fuse repair process, without using an external pad and a metal mask option. CONSTITUTION: A test mode circuit(10) outputs a test mode signal. A repair mirror circuit(20) includes a resistor and a fuse connected between a power supply voltage source and a ground voltage source serially, and outputs a repair signal by repairing the fuse according to the state of the test mode signal. And an input/output structure determination circuit(30) selects one of the input/output structures by performing an exclusive OR operation of the test mode signal and the repair signal.
申请公布号 KR20040092723(A) 申请公布日期 2004.11.04
申请号 KR20030026278 申请日期 2003.04.25
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, DEOK JU
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
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