METHOD AND APPARATUS FOR IDENTIFICATION OF COMPLEX DEFECTIVE PIXEL MAP

摘要

PROBLEM TO BE SOLVED: To identify defective pixel in a large area solid X-ray detector for reducing burden of the operator without relying on subjective criterion of the operator. SOLUTION: Each pixel of the detector generates the initial strength signal to define the initial image. A processor (36) memorizes the initial defective pixel map (30) containing the known defective pixel assembly, and after generating the signal, a strength signal for substitute of the defective pixel is generated by automatically using the strength signal corresponding to the pixel except for defective pixel assembly, and forms the compensated image (66). The device for identification of additional defective pixel detects at least one of the initial image and the compensated image after collecting image data, and identifies the pixel assembly having high possibility of additional defects containing pixel with unexpected value (72). COPYRIGHT: (C)2005,JPO&NCIPI