发明名称 MAGNETIC RAM ELEMENT HAVING REFERENCE CELL AND ITS STRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide a magnetic RAM(random access memory) element proper for increasing a sensitivity tolerance and integration of a sensing amplifier. SOLUTION: The magnetic RAM element includes main array portions A1, A2 and a reference cell array portion B. The main array portions A1, A2 have a plurality of main cells located along a line and column in two dimensions, and they have a reference access transistor and main magnetic resistor 40a connected connected in series respectively. The reference cell array portion B has a plurality of reference cells located in a direction of column in one dimension. and they have a reference access transistor and reference magnetic resistor 40b connected in series respectively. The main magnetic resistor 40a is arrayed in one direction on plane, and the reference magnetic resistor 40b is arrayed so as to intersect it, therefore, each of the reference magnetic resistors 40b always have a value between the maximum and minimum of the main magnetic resistor 40a. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004311942(A) 申请公布日期 2004.11.04
申请号 JP20030400314 申请日期 2003.11.28
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 JEONG WON-CHEOL
分类号 H01L27/105;G11C11/14;G11C11/15;G11C11/16;H01L21/8246;H01L27/10;H01L27/22;H01L29/82;H01L43/00;H01L43/08;(IPC1-7):H01L27/105 主分类号 H01L27/105
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