发明名称 Composition for forming porous film, porous film and method for forming the same, interlevel insulator film, and semiconductor device
摘要 Provided are a composition for forming film which can form porous film excelling in dielectric constant, adhesiveness, uniformity of the film, mechanical strength and having low hygroscopicity; porous film and a method for forming the film; and a high-performing and highly reliable semiconductor device comprising the porous film inside. More specifically, provided is a composition for forming porous film, the composition comprising siloxane polymer and one or more quaternary ammonium salts represented by following formula (1) or (2): [(R<1>)4N]+[R<2>X]<-> (1) Hk[(R<1>)4N]m<+>Y<-> (2) wherein X represents CO2, OSO3 or SO3; Y represents SO4, SO3, CO3, O2C-CO2, NO3 or NO2; and k is 0 or 1, m is 1 or 2 and n is 1 or 2 in proviso that n=1 requires k=0 and m=1, and n=2 requires k=O and m=2, or k=1 and m=1.
申请公布号 US2004219372(A1) 申请公布日期 2004.11.04
申请号 US20030706862 申请日期 2003.11.12
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 OGIHARA TSUTOMU;YAGIHASHI FUJIO;HAMADA YOSHITAKA;ASANO TAKESHI;IWABUCHI MOTOAKI;NAKAGAWA HIDEO;SASAGO MASARU
分类号 B32B5/18;B32B7/02;C01B37/00;C08G77/388;C08K5/19;C09D5/25;C09D183/04;C09D183/14;C23C18/12;H01L21/312;H01L21/316;H01L21/768;H01L23/522;(IPC1-7):B32B25/20 主分类号 B32B5/18
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