| 摘要 |
PROBLEM TO BE SOLVED: To certainly judge whether abnormality occurs in a machine device. SOLUTION: This monitor has a monitor index acquiring and processing means for acquiring a monitor index for setting the monitor value of the machine device as a time series pattern, a specific value calculating and processing means 92 for calculating the specific value in the monitor index acquired as the time series pattern, a maximum value calculating and processing means for calculating the maximum value in the specific value at every trial and an operational processing means for calculating the monitor value on the basis of the maximum value according to a predetermined formula. In this case, it can be grasped whether an integrated value pattern judged to be normal in the respective past trials takes how large value, on the basis of the monitor value. COPYRIGHT: (C)2005,JPO&NCIPI
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