发明名称 METHOD FOR PROCESSING SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide semiconductor substrate processing technology capable of improving the performance of a solid immersion lens in the case of processing the semiconductor substrate and forming the solid immersion lens on the surface of the semiconductor substrate. SOLUTION: The semiconductor substrate 1 is irradiated with focused ion beams 5 to form a convex part 2 acting as a solid immersion lens on a main surface 3a. The shaved quantity of the semiconductor substrate 1 due to the focused ion beams 5 is controlled by changing the irradiation time of the focused ion beams 5 to the semiconductor substrate 1. Consequently, the surface of the convex part 2 becomes an accurate curved surface, and the performance of the convex part 2 as the solid immersion lens can be improved. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004311823(A) 申请公布日期 2004.11.04
申请号 JP20030105272 申请日期 2003.04.09
申请人 RENESAS TECHNOLOGY CORP 发明人 YOSHIDA TAKESHI;KOYAMA TORU;MASUKO YOJI
分类号 H01L21/302;G02B3/00;H01L21/268;H01L27/14;(IPC1-7):H01L21/302 主分类号 H01L21/302
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