发明名称 Fabrication method of semiconductor device
摘要 The present invention comprises the steps of forming a connection hole in an interlayer insulating film including an organic insulating film; forming an inorganic film covering on an upper surface of the interlayer insulating film and an inner surface of the connection hole; forming an organic film for filling inside the connection hole on an inorganic film; removing the organic film inside the connection hole so as to leave a part of the organic film at a bottom of the connection hole; forming a wiring trench connecting to the connection hole in the interlayer insulating film; removing the organic film inside the connection hole; removing the inorganic film; and forming a trench wiring by filling a conductive material in the wiring trench and inside the connection hole and forming a plug continuing from the trench wiring.
申请公布号 US6812133(B2) 申请公布日期 2004.11.02
申请号 US20030653986 申请日期 2003.09.04
申请人 SONY CORPORATION 发明人 TAKEUCHI KOICHI
分类号 H01L21/28;H01L21/768;H01L23/522;(IPC1-7):H01L21/476;H01L21/44 主分类号 H01L21/28
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