发明名称 Semiconductor memory cell and semiconductor memory device
摘要 An insulating film with a linear concave portion is formed and a semiconductor film is formed thereon by deposition. The semiconductor film is irradiated with laser light to melt the semiconductor film and the melted semiconductor is poured into the concave portion, where it is crystallized. This makes distortion or stress accompanying crystallization concentrate on other regions than the concave portion. A surface of this crystalline semiconductor film is etched away, thereby forming in the concave portion a crystalline semiconductor film which is covered with side walls of the concave portion from the sides and which has no other grain boundaries than twin crystal. TFTs and memory TFTs having this crystalline semiconductor film as their channel regions are highly reliable, have high field effect mobility, and are less fluctuated in characteristic. Accordingly, a highly reliable semiconductor memory device which can operate at high speed is obtained.
申请公布号 US6812491(B2) 申请公布日期 2004.11.02
申请号 US20030393768 申请日期 2003.03.21
申请人 发明人
分类号 H01L21/28;H01L21/336;H01L21/77;H01L21/8247;H01L21/84;H01L27/105;H01L27/115;H01L27/12;H01L29/04;H01L29/786;H01L29/788;(IPC1-7):H01L29/76 主分类号 H01L21/28
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