发明名称 Integrated decoupling capacitors
摘要 A method for fabricating buried decoupling capacitors in an integrated circuit is disclosed. The method forms decoupling capacitors by creating an opening within a substrate which has fin-like spacers, depositing a dielectric material over the spacers, depositing an electrode material over the dielectric material, depositing an insulative material over the electrode material, and forming integrated circuit components over the insulative material.
申请公布号 US6812109(B2) 申请公布日期 2004.11.02
申请号 US20030372813 申请日期 2003.02.26
申请人 MICRON TECHNOLOGY, INC. 发明人 AHN KIE Y.;FORBES LEONARD
分类号 H01L21/02;H01L21/334;H01L29/94;(IPC1-7):H01L21/20 主分类号 H01L21/02
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