发明名称 APPARATUS AND METHODS FOR MEASURING RESISTANCE OF CONDUCTIVELAYERS
摘要 Apparatus and methods for measuring the electrical resistance of conducti ve materials are disclosed. In one embodiment, an apparatus includes a housing, and first, second, third, and fourth conductive members projecting outwardly fro m the housing. The conductive members are engageable with an electrically-conducti ve material at a plurality of points distributed along a measurement axis. In a n alternate embodiment, at least some of the conductive members include a spring-loaded portion such that a contact portion of the conductive member projects outwardly from the housing by a variable distance, In operation, the electrical resistance of t he electrically-conductive material is determinable from a known current applie d between the first and fourth conductive members, and a voltage measured between the second and third conductive members.
申请公布号 CA2464036(A1) 申请公布日期 2004.10.30
申请号 CA20042464036 申请日期 2004.04.13
申请人 THE BOEING COMPANY 发明人 POLLACK, MARK S.;NEGLEY, MARK A.;ERICKSON, GARY C.
分类号 G01R27/08;B64D45/02;B64F5/00;G01R27/02;G01R27/14;G01R31/26 主分类号 G01R27/08
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