| 摘要 |
PROBLEM TO BE SOLVED: To provide a multifunctional large scale integrated circuit for simplifying work in a test of individual circuit blocks in a test method of the multifunctional large scale integrated circuit having a plurality of circuit blocks. SOLUTION: Information on whether or not to test any circuit block is stored in a ROM 60. When a power source is supplied, a test mode setting control signal is generated by a logical circuit 50 on the basis of information of this ROM. A selector control part 41 of a test control circuit 40 controls selectors 31, 32, 33, and 34 for selecting an input signal to the individual circuit blocks and an output signal from the individual circuit blocks on the basis of the test mode setting control signal. A delay circuit control part 42 of the test control circuit 40 controls delay circuits 21, 22, 23, and 34 for delaying the input signal to the individual circuit blocks and the output signal from the individual circuit blocks. COPYRIGHT: (C)2005,JPO&NCIPI
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