发明名称 METHOD OF FABRICATING TFT WITH SELF-ALIGNED STRUCTURE
摘要 A method of fabricating a thin film transistor (TFT) with self-aligned structure. A substrate is provided, with a semiconductor layer and gate insulation layer formed in sequence thereon, followed by formation of a conductive layer on the gate insulation layer, and definition of the conductive layer to form a gate conductive layer and a dummy conductive layer. The dummy conductive layer is on both sides of the gate conductive layer and provided with a gap therebetween. A first ion implantation is performed via the gap to form a lightly doped region on the semiconductor layer thereunder, and a sacrificial layer is formed to fill the gap. The dummy conductive layer is removed. The gate conductive layer and the remaining sacrificial layer are used as a mask. Finally, a second ion implantation is performed to form a heavily doped source/drain region on the semiconductor layer.
申请公布号 US2004214378(A1) 申请公布日期 2004.10.28
申请号 US20030420453 申请日期 2003.04.22
申请人 TOPPOLY OPTOELECTRONICS CORP. 发明人 LIN HSIAO-YI;CHANG WEI CHIH
分类号 H01L21/336;H01L29/786;(IPC1-7):H01L21/00;H01L21/84 主分类号 H01L21/336
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