发明名称 SEMICONDUCTOR DEVICE WITHOUT INVERSE NARROW CHANNEL EFFECT AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to restrain effectively inverse narrow channel effect by forming a second semiconductor layer containing predetermined impurities on a first semiconductor layer within a trench. CONSTITUTION: A trench(10) is formed in a semiconductor substrate(1). An isolation layer(2) is filled in the trench. A first semiconductor layer(4) is formed along sides of the trench. A second semiconductor layer(5) is formed on the first semiconductor layer within the trench region. The second semiconductor layer contains predetermined impurities of the same conductive type as a channel region of a predetermined transistor. The first semiconductor layer is capable of restraining the predetermined impurities of the second semiconductor layer from being diffused due to a heat treatment.
申请公布号 KR20040091530(A) 申请公布日期 2004.10.28
申请号 KR20040001925 申请日期 2004.01.12
申请人 RENESAS TECHNOLOGY CORP. 发明人 EIKYU KATSUMI
分类号 H01L21/76;H01L21/265;H01L21/762;H01L29/10;H01L29/78;(IPC1-7):H01L21/76 主分类号 H01L21/76
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