发明名称 |
SEMICONDUCTOR DEVICE WITHOUT INVERSE NARROW CHANNEL EFFECT AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to restrain effectively inverse narrow channel effect by forming a second semiconductor layer containing predetermined impurities on a first semiconductor layer within a trench. CONSTITUTION: A trench(10) is formed in a semiconductor substrate(1). An isolation layer(2) is filled in the trench. A first semiconductor layer(4) is formed along sides of the trench. A second semiconductor layer(5) is formed on the first semiconductor layer within the trench region. The second semiconductor layer contains predetermined impurities of the same conductive type as a channel region of a predetermined transistor. The first semiconductor layer is capable of restraining the predetermined impurities of the second semiconductor layer from being diffused due to a heat treatment.
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申请公布号 |
KR20040091530(A) |
申请公布日期 |
2004.10.28 |
申请号 |
KR20040001925 |
申请日期 |
2004.01.12 |
申请人 |
RENESAS TECHNOLOGY CORP. |
发明人 |
EIKYU KATSUMI |
分类号 |
H01L21/76;H01L21/265;H01L21/762;H01L29/10;H01L29/78;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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