SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device provided with a diagnostic circuit which does not deteriorate logic element delay at the time of normal operation. SOLUTION: In a latch circuit provided on the input side of an output part or a logical step of a memory circuit, a signal selection circuit is provided in a feed back loop of the latch circuit and the signal selection circuit is switched correspondingly to operation modes. A return signal is transmitted in the normal operation and a test signal is transmitted at the time of test operation to prevent an increase of delay due to the signal selection circuit in a main path in the normal operation. COPYRIGHT: (C)2005,JPO&NCIPI