发明名称 |
INSPECTION METHOD OF CARBON AGGREGATE IN EPOXY RESIN COMPOSITION |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an inspection method of a carbon aggregate in an epoxy resin composition for semiconductor sealing. <P>SOLUTION: This method for inspecting the carbon aggregate in the epoxy resin composition including carbon black is characterized by observing the molding surface comprising the composition by an infrared microscope having imaging element spectral sensitivity of 400 to 1,200 nm. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
申请公布号 |
JP2004301572(A) |
申请公布日期 |
2004.10.28 |
申请号 |
JP20030092803 |
申请日期 |
2003.03.28 |
申请人 |
SUMITOMO BAKELITE CO LTD |
发明人 |
SAMEJIMA KENJI;AKASAKA YOSHIYUKI |
分类号 |
G01N21/35;G01N21/3563;G01N21/359;(IPC1-7):G01N21/35 |
主分类号 |
G01N21/35 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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