发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a technology for improving the high frequency power gain of an LDMOS. SOLUTION: The distance from the surface of a passivation film covering an electrode pad to the rear face of a silicon substrate is set to be not more than 200μm, or a groove 36 is formed in depth of not less than 2μm in which an insulating film or a conductor is embedded between a part where p-type impurity is diffused when a p<SP>+</SP>-type source punching layer 9 is formed and a channel region of third LDMOSTr<SB>3</SB>from a surface of a semiconductor layer 2b to the silicon substrate 2a. Spreading of the p<SP>+</SP>-type source punching layer 2 to the channel region is suppressed by the groove 36. Thus, inductance or resistance of a source are dropped and the high frequency power gain is improved. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004303883(A) 申请公布日期 2004.10.28
申请号 JP20030093783 申请日期 2003.03.31
申请人 RENESAS TECHNOLOGY CORP 发明人 KUROTANI KINGO;SAKAMOTO TSUYOSHI;YANO MICHIO;NAKURA KENICHI
分类号 H01L21/66;H01L27/01;H01L27/02;H01L27/088;H01L29/06;H01L29/08;H01L29/417;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L21/66
代理机构 代理人
主权项
地址