发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a technology for improving the high frequency power gain of an LDMOS. SOLUTION: The distance from the surface of a passivation film covering an electrode pad to the rear face of a silicon substrate is set to be not more than 200μm, or a groove 36 is formed in depth of not less than 2μm in which an insulating film or a conductor is embedded between a part where p-type impurity is diffused when a p<SP>+</SP>-type source punching layer 9 is formed and a channel region of third LDMOSTr<SB>3</SB>from a surface of a semiconductor layer 2b to the silicon substrate 2a. Spreading of the p<SP>+</SP>-type source punching layer 2 to the channel region is suppressed by the groove 36. Thus, inductance or resistance of a source are dropped and the high frequency power gain is improved. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2004303883(A) |
申请公布日期 |
2004.10.28 |
申请号 |
JP20030093783 |
申请日期 |
2003.03.31 |
申请人 |
RENESAS TECHNOLOGY CORP |
发明人 |
KUROTANI KINGO;SAKAMOTO TSUYOSHI;YANO MICHIO;NAKURA KENICHI |
分类号 |
H01L21/66;H01L27/01;H01L27/02;H01L27/088;H01L29/06;H01L29/08;H01L29/417;H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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