发明名称 Semiconductor device and method of manufacturing the same
摘要 There are provided a first insulating film over a semiconductor substrate, a capacitor formed on the first insulating film and having a lower electrode, a ferroelectric film, and an upper electrode, a capacitor-protection insulating film formed on the capacitor to apply a tensile stress of more than 2.0x10<9 >dyn/cm<2 >to the capacitor, and a second insulating film formed on the capacitor-protection insulating film to apply a compressive stress of more than 2.6x10<9 >dyn/cm<2 >to the capacitor.
申请公布号 US2004212041(A1) 申请公布日期 2004.10.28
申请号 US20030462702 申请日期 2003.06.17
申请人 FUJITSU LIMITED 发明人 TAKAMATSU TOMOHIRO;SASHIDA NAOYA;SATO NAOYUKI
分类号 H01L21/316;H01L21/02;H01L21/8246;H01L27/105;H01L27/115;(IPC1-7):H01L29/00 主分类号 H01L21/316
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