发明名称 Strained-channel transistor and methods of manufacture
摘要 A semiconductor device includes a region of semiconductor material with first and second isolation trenches formed therein. The first isolation trench is lined with a first material having a low oxygen diffusion rate and is filled with an insulating material. The second isolation trench is not lined with the first material but is filled with an insulating material. A first transistor is formed adjacent the first isolation region and a second transistor formed adjacent the second isolation region.
申请公布号 US2004212035(A1) 申请公布日期 2004.10.28
申请号 US20030423513 申请日期 2003.04.25
申请人 YEO YEE-CHIA;KO CHIH-HSIN;LEE WEN-CHIN;HU CHENMING 发明人 YEO YEE-CHIA;KO CHIH-HSIN;LEE WEN-CHIN;HU CHENMING
分类号 H01L21/762;H01L21/8238;H01L27/12;(IPC1-7):H01L21/823;H01L29/00 主分类号 H01L21/762
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