发明名称 Redundancy control circuit which surely programs program elements and semiconductor memory using the same
摘要 A redundancy control circuit includes a plurality of program elements and a voltage control section. In the plurality of program elements, a defect address indicating a position of a defect is programmed by a dielectric breakdown due to applying of a voltage. The voltage control section applies the voltage to a part of a plurality of targeted program elements simultaneously. The plurality of targeted program elements is a part of the plurality of program element to be dielectrically broken down correspondingly to the defect address.
申请公布号 US2004213056(A1) 申请公布日期 2004.10.28
申请号 US20040809044 申请日期 2004.03.25
申请人 FUJIMA SHIRO 发明人 FUJIMA SHIRO
分类号 G11C29/04;G11C11/401;G11C17/16;G11C17/18;G11C29/00;H01L29/06;(IPC1-7):H01L29/06 主分类号 G11C29/04
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