发明名称 Method of manufacturing MOS transistor having short channel
摘要 The MOS transistor of the present invention is manufactured by a conventional complementary MOS transistor technology. In the manufacturing method of the MOS transistor having nanometer dimensions, a gate having dimensions at a nanometer scale can be formed through control of the width of spacers instead of with a specific lithography technology. The doped spacers are used for forming source/drain extension regions having an ultra-shallow junction, thereby avoiding damage on the substrate caused by ion implantation. In addition, a dopant is diffused from the doped space into a semiconductor substrate through annealing to form the source/drain extension regions having an ultra-shallow junction.
申请公布号 US2004214382(A1) 申请公布日期 2004.10.28
申请号 US20040834306 申请日期 2004.04.27
申请人 PARK IL-YONG;KIM SANG-GI;YU BYOUNG-GON;KIM JONG-DAE;ROH TAE-MOON;LEE DAE-WOO;YANG YIL-SUK 发明人 PARK IL-YONG;KIM SANG-GI;YU BYOUNG-GON;KIM JONG-DAE;ROH TAE-MOON;LEE DAE-WOO;YANG YIL-SUK
分类号 H01L21/225;H01L21/336;H01L29/78;(IPC1-7):H01L21/336;H01L21/823;H01L21/476 主分类号 H01L21/225
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