发明名称 |
Configuration in which wafers are individually supplied to fabrication units and measuring units located in a fabrication cell |
摘要 |
A configuration for treating wafers in at least one clean room includes a configuration of production units and measuring units that receive wafers via a transport system for transporting cassettes. Several functionally allocated production units and/or measuring units are combined to form a manufacturing cell which is provided with a loading and unloading station for receiving and forwarding cassettes with wafers. Individual wafers can be supplied to the production units and/or measuring units within the manufacturing cell in order to be treated.
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申请公布号 |
US6809510(B2) |
申请公布日期 |
2004.10.26 |
申请号 |
US20010015150 |
申请日期 |
2001.11.07 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
GOETZKE MICHAEL |
分类号 |
B65G49/07;H01L21/00;H01L21/677;(IPC1-7):G01R31/02 |
主分类号 |
B65G49/07 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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