发明名称 Configuration in which wafers are individually supplied to fabrication units and measuring units located in a fabrication cell
摘要 A configuration for treating wafers in at least one clean room includes a configuration of production units and measuring units that receive wafers via a transport system for transporting cassettes. Several functionally allocated production units and/or measuring units are combined to form a manufacturing cell which is provided with a loading and unloading station for receiving and forwarding cassettes with wafers. Individual wafers can be supplied to the production units and/or measuring units within the manufacturing cell in order to be treated.
申请公布号 US6809510(B2) 申请公布日期 2004.10.26
申请号 US20010015150 申请日期 2001.11.07
申请人 INFINEON TECHNOLOGIES AG 发明人 GOETZKE MICHAEL
分类号 B65G49/07;H01L21/00;H01L21/677;(IPC1-7):G01R31/02 主分类号 B65G49/07
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