发明名称 Flash memory structure using sidewall floating gate
摘要 A flash memory and a method of forming a flash memory, includes forming a polysilicon wordline on a substrate, the wordline having first and second sidewalls, the first sidewall being tapered, with respect to a surface of the substrate, to have a slope angle and the second sidewall having a slope angle greater than the slope angle of the first sidewall. Thereafter, a polysilicon spacer is formed on the second sidewall while simultaneously removing the polysilicon on the first sidewall. The polysilicon spacer forms a floating gate which is surrounded on a plurality of sides by the second sidewall.
申请公布号 US6809372(B2) 申请公布日期 2004.10.26
申请号 US20010756177 申请日期 2001.01.09
申请人 IBM 发明人 GAMBINO JEFFREY P;HSU LOUIS L;MANDELMAN JACK A;WHEELER DONALD C
分类号 H01L21/28;H01L21/336;H01L27/115;H01L29/423;H01L29/788;(IPC1-7):H01L29/788 主分类号 H01L21/28
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