| 摘要 |
A method is disclosed for remedying defective cells that enables automatic cutting of capacitor fuses as part of the fabrication process. A comparison circuit determines whether defective cells are present in a memory cell array by comparing data that have been read from an I/O bus with data that have been determined in advance to determine whether the data are identical and supplies the determination result as a determination signal. An address buffer circuit, upon receiving a determination signal from the comparison circuit, latches the row address signal and column address signal that are being supplied as output at that time and supplies these latched signals as a capacitor fuse row address signal and a capacitor fuse column address signal for cutting capacitor fuses. Capacitor fuses in a capacitor fuse block are then each cut based on the capacitor fuse row/column address signals that have been latched by the address buffer circuit.
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