发明名称 Plasma processing method and apparatus
摘要 The interior of a vacuum chamber is maintained at a specified pressure by introducing a specified gas into the vacuum chamber having a plasma trap provided therein. Simultaneously, therewith, evacuation of the chamber is performed by a pump as an evacuating device, and a high-frequency power of 100 MHz is supplied to a counter electrode by counter electrode use high-frequency power supply. Thus, uniform plasma is generated within the vacuum chamber, where plasma processing such as etching, deposition, and surface reforming can be carried out uniformly with a substrate placed on a substrate electrode.
申请公布号 US6808759(B1) 申请公布日期 2004.10.26
申请号 US20000511398 申请日期 2000.02.23
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 OKUMURA TOMOHIRO;HARAGUCHI HIDEO;MATSUI TAKUYA;MATSUDA IZURU;MITSUHASHI AKIO
分类号 C23C16/505;H01J37/32;(IPC1-7):H05H1/46;H05H1/02;C23C16/507 主分类号 C23C16/505
代理机构 代理人
主权项
地址