发明名称 Method of making a thin film transistor using laser annealing
摘要 The present invention is characterized in that gettering is performed such that impurity regions to which a noble gas element is added are formed in a semiconductor film and the metallic element included in the semiconductor film is segregated into the impurity regions by laser annealing. Also, a reflector is provided under a substrate on which a semiconductor film is formed. When laser light transmitted through the semiconductor film substrate is irradiated from the front side of the substrate, the laser beam is reflected by the reflector and thus the laser light can be irradiated to the semiconductor film from the read side thereof. Laser light can be also irradiated to low concentration impurity regions overlapped with a portion the gate electrode. Thus, an effective energy density in the semiconductor film is increased to thereby effect recovery of crystallinity and activation of the impurity element.
申请公布号 US6809012(B2) 申请公布日期 2004.10.26
申请号 US20020034498 申请日期 2002.01.03
申请人 SEMICONDUCTOR ENERGY LAB 发明人 YAMAZAKI SHUNPEI;MURAKAMI SATOSHI;OHNUMA HIDETO;NAKAMURA OSAMU;TANAKA KOICHIRO;ARAI YASUYUKI
分类号 H01L21/00;H01L21/268;H01L21/322;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L29/47 主分类号 H01L21/00
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