X-ray fluorescence thickness measurement device,申请号US20010916519-传众专利搜索

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发明名称	X-ray fluorescence thickness measurement device
摘要
申请公布号	US6810106(B2)	申请公布日期	2004.10.26
申请号	US20010916519	申请日期	2001.07.27
申请人	SII NANOTECHNOLOGY INC	发明人	SATO MASAO
分类号	G01B15/02;G01N23/223;G01T1/36;G21K1/02;G21K1/06;(IPC1-7):G01B15/02	主分类号	G01B15/02
代理机构		代理人
主权项
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