APPARATUS FOR TESTING ELECTRONIC COMPONENT, IN WHICH PLURAL LEAD AND BALL ARE ADDED

摘要

PURPOSE: An apparatus for testing an electronic component is provided to reduce the test cost and the test period by simplifying a connecting structure for transmitting an electric signal to the electronic component. CONSTITUTION: An apparatus for testing an electronic component includes a test head and a conductive connection member. The test head(100) is electrically connected to a tester for testing and analyzing an electrical operation of the electronic component. The conductive connection member is electrically connected to plural terminal holes of a board of the test head. In addition, the conductive connection member is used for connecting electrically the electronic component to a board of the test head. The electronic component is formed with an IC(30) having plural leads and plural balls. The connection member is formed with a pogo-pin(120) including an elastic spring.