发明名称 MEMORY MODEL TEST METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a method that efficiently tests a memory model by associating the contents of registers necessary to search functions with a test item. <P>SOLUTION: For occasional changes in the contents of registers 1 of a memory with search functions, register contents depending on search functions and test items are stored in a signal information file 5. Signal generation information uniquely depending on a signal generation identifier is acquired from the signal information file, and according to the signal generation information, the contents of the registers of the memory can be changed. The contents of the registers of the memory with search functions can be dynamically assigned in dependence on search functions or test items to realize a wide range of tests of a memory model. This solves the disadvantages that a memory with search functions has various registers that each have information necessary to a search, and that a test of the functions of the memory requires occasional changes in the contents of the registers. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004295453(A) 申请公布日期 2004.10.21
申请号 JP20030086822 申请日期 2003.03.27
申请人 HITACHI LTD 发明人 NAKAJIMA TERUO
分类号 G01R31/28;G06F11/22;G06F12/16;G06F17/50 主分类号 G01R31/28
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