发明名称 SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREOF AND STATIC PROTECTION CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which accelerates switching speed without relying on precision of a manufacturing device, and to provide a static protection circuit and a method for manufacturing the semiconductor device. SOLUTION: A MOS transistor 10 comprises a substrate region 12, a first and second impurity regions 14, 16 which are formed in the substrate region 12, a first and second gate conductive layers 22, 24 which are formed on a channel region between the first and the second impurity regions 14, 16 in the substrate region 12 through an insulating film, a first gate wiring layer 26 which is electrically connected to the first gate conductive layer 22, and a second gate wiring layer 28 which is electrically connected to the second gate conductive layer 24. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004296680(A) 申请公布日期 2004.10.21
申请号 JP20030085783 申请日期 2003.03.26
申请人 SEIKO EPSON CORP 发明人 KAWAGUCHI KAZUO
分类号 H01L29/423;H01L21/822;H01L27/04;H01L29/41;H01L29/49;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/423
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