EXEMPT SOURCE FOR AN X-RAY FLUORESCENCE DEVICE

摘要

An x-ray fluorescence (XRF) device and a method for using the same to analyze a sample are described. The x-ray source of the XRF device has a configuration that allows a greater amount of x-rays to impinge on the sample being irradiated with x-rays. The x-ray detector of the XRF device has a configuration that allows a greater amount of x-rays emitted by the sample to impinge on the detector. With such a configuration, the size and cost of the x-ray fluorescence device decreases. As well, fewer x-rays are needed from the x-ray source because of the greater efficiency and an exempt x-ray source (exempt from radioactivity licensing requirements) can be used.