发明名称 |
Reflective surface analysis method for inspecting/checking a reflective shiny mirror-like surface moves/changes an existing or created pattern to produce images on a surface at different times |
摘要 |
<p>A pattern that exists and/or is created near to a surface (10') is moved and/or changed. Each image of the pattern reflected on the surface is picked up at different points of time, e.g. before, once or several times during and after the pattern is moved and/or changed. An independent claim is also included for a device for inspecting/checking a reflective shiny mirror-like surface.</p> |
申请公布号 |
DE10317078(A1) |
申请公布日期 |
2004.10.21 |
申请号 |
DE2003117078 |
申请日期 |
2003.04.11 |
申请人 |
UNIVERSITAET KARLSRUHE (TH) INSTITUT FUER MESS- UND REGELUNGSTECHNIK |
发明人 |
KAMMEL, SOEREN;PUENTE-LEON, FERNANDO |
分类号 |
G01N21/88;(IPC1-7):G01N21/88 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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