发明名称 TESTING METHOD AND TESTING APPARATUS OF BONDING TERMINAL MEMBER
摘要 PROBLEM TO BE SOLVED: To enable direct measurement of adhesion ability of each bonding terminal member after real mounting on a mounting substrate, regarding a testing method of a bonding terminal member and a testing apparatus of a bonding terminal member. SOLUTION: A stress generating plate 3 is made to face an electronic component 1 to which a bonding terminal members 2 are bonded with a gap. Measurement pins 5 are heated and bonded to the bonding terminal members 2 through apertures arranged on the stress generating plate 3. At least one of adhesion strength and electrical property of the bonding terminal members 2 is measured in the state of bonding. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004296566(A) 申请公布日期 2004.10.21
申请号 JP20030084188 申请日期 2003.03.26
申请人 FUJITSU LTD 发明人 SUEHIRO MITSUO
分类号 H05K3/34;H01L21/60;(IPC1-7):H05K3/34 主分类号 H05K3/34
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