Attention model enhanced video waveform monitor

摘要

An attention model enhanced video waveform monitor for identifying and measuring problem areas in a video signal weights the problem areas according to an attentional mapping/masking model. An input video signal is analyzed to produce measurement errors that identify the problem areas. These errors are qualified against a visually masked area and attentional map derived from the video signal. The errors that occur outside the visually masked area within the attentional map are highlighted for an operator on a picture monitor as being significant problem areas for a viewer.